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JEDEC JESD22-A103E.01

HIGH TEMPERATURE STORAGE LIFE
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JEDEC JESD22-A103E.01

HIGH TEMPERATURE STORAGE LIFE

PUBLISH DATE 2021
JEDEC JESD22-A103E.01
The test is applicable for evaluation, screening, monitoring, and/or qualification of all solid state devices. The high temperature storage test is typically used to determine the effects of time and temperature, under storage conditions, for thermally activated failure mechanisms and time-to failure distributions of solid state electronic devices, including nonvolatile memory devices (data retention failure mechanisms). Thermally activated failure mechanisms are modeled using the Arrhenius Equation for acceleration. During the test, accelerated stress temperatures are used without electrical conditions applied. This test may be destructive, depending on time, temperature and packaging (if any). A list of RAND License Assurance/Disclosure Forms is available to JEDEC members on the restricted Members' website. Non-members may obtain individual Assurance/Disclosure forms by requesting them from the JEDEC office.
SDO JEDEC: LEGACY IMPORT
Document Number
Publication Date July 1, 2021
Language en - English
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