Standard Test Method for Majority Carrier Concentration in Semiconductors by Measurement of Wavenumber or Wavelength of the Plasma Resonance Minimum (Withdrawn 2003)

Standard Test Method for Thickness of Heteroepitaxial or Polysilicon Layers (Withdrawn 2002)

Standard Specification for Carbonized Nickel Strip and Carbonized Nickel-Plated and Nickel-Clad Steel Strip for Electron Tubes

Method for Preparing Monocrystalline Test Ingots of Silicon by the Vertical-Pulling (Czochralski) Technique (Withdrawn 1988)

Standard Consumer Safety Specification for Lighters

Method of Test for Yield and Maintenance Factors for Gaskets (Withdrawn 1978)

Standard Practice for Safe Handling of Solvent Cements, Primers, and Cleaners Used for Joining Thermoplastic Pipe and Fittings

Standard Test Method for Tires for Wet Traction in Straight-Ahead Braking, Using Highway Vehicles (Withdrawn 2007)

Standard Consumer Safety Specification for High Chairs

Standard Specification for Corrugated Polyethylene (PE) Tubing and Fittings

Standard Consumer Safety Specification for Non-Full-Size Baby Cribs/Play Yards

Standard Test Method for Tires for Wet Traction in Straight-Ahead Braking, Using a Towed Trailer

Standard Specification for Thermoplastic Accessible and Replaceable Plastic Tube and Tubular Fittings

Practice for Preparing Silicon Single Crystals by the Floating-Zone Technique for Evaluation of Polysilicon Ingot (Withdrawn 1996)

Standard Test Method for Wear Layer Thickness of Resilient Floor Coverings by Optical Measurement

Method for Service-Free Life Evaluation of Air Handling System of Household Canister, Stick, Hand-Held, and Utility Vacuum Cleaners (Withdrawn 1988)

Standard Terminology Relating to Plastic Piping Systems

Standard Practice for Preparation of an Offset Duplicator for Use in Functional Testing of Lithographic Copy Products (Withdrawn 2002)

Standard Test Method for Energy Absorbed by a Tire When Deformed by Slow-Moving Plunger

Standard Test Method for Curl in Carbon Paper

Test Method for Detection of Oxidation Induced Defects in Polished Silicon Wafers (Withdrawn 1998)

Test Method for Flexural Strength (Modulus of Rupture) of Electronic-Grade Ceramics (Withdrawn 2001)

Standard Practice for Preparation of Samples of the Constant Composition Region of Epitaxial Gallium Arsenide Phosphide for Hall Effect Measurements

Test Method for Determining Carrier Density in Silicon Epitaxial Layers by Capacitance-Voltage Measurements on Fabricated Junction or Schottky Diodes (Withdrawn 2001)

Standard Test Methods for Conductivity Type of Extrinsic Semiconducting Materials (Withdrawn 2003)