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A collection of featured documents from our library that are popular among our users or otherwise noteworthy.
Specification for Self-Curing Acrylic Resins Used in Neurosurgery (Withdrawn 1993)
Test Method for Aerospace Materials Response to Flame, with Vertical Test Specimen (For Aerospace Vehicles Standard Conditions) (Withdrawn 1998)
Standard Test Method for Effects of Cleaning and Chemical Maintenance Materials on Painted Aircraft Surfaces
Practice for Preparing Aircraft Cleaning Compounds (Withdrawn 1988)
Standard Practice for the Comparative Evaluation of the Imaging Properties of Liquid Electrostatic Toners
Standard Practice for Assessing the Quality of Direct-Image Paper Offset Masters (Withdrawn 2002)
Standard Practice for Specifying Thick-Film Pastes
Standard Practice for Testing One-Time Carbonizing Tissue for Pinholes
Standard Test Method for Quality of Cut (Joint Tightness) of Resilient Floor Tile
Standard Specification for Smooth-Wall Poly(Vinyl Chloride) (PVC) Conduit and Fittings for Underground Installation
Method for Laboratory Test for Force and Moment Properties of Passenger Car Tires (Withdrawn 1988)
Practice for Determining Effective Adhesion of Photoresist to Hard-Surface Photomask Banks and Semiconductor Wafers During Etching (Withdrawn 1996)
Test Method for Stacking Fault Density of Epitaxial Layers of Silicon by Interference-Contrast Microscopy (Withdrawn 1998)
Standard Practice for Unaided Visual Inspection of Polished Silicon Wafer Surfaces
Test Methods for Measuring Beam Divergence of Pulsed Lasers by the Apertured-Detector Technique (Withdrawn 2001)
Standard Test Method for Measuring Resistivity of Silicon Wafers Using a Spreading Resistance Probe (Withdrawn 2003)
Standard Test Method for Using Calorimeters for Total Dose Measurements in Pulsed Linear Accelerator or Flash X-ray Machines
Practice for Adjusting Photoresist Exposure Time (Withdrawn 1996)
Standard Test Method of Measurement of Common-Emitter D-C Current Gain of Junction Transistors
Method for Interpretation of Interferograms of Nominally Plane Wavefronts (Withdrawn 1994)
Test Methods for Measuring Width of Defects in Optical Surfaces, Using Nomarski Differential Microscopy (Withdrawn 1994)
Standard Test Method for Thickness and Thickness Variation of Silicon Wafers
Standard Test Method for Bow of Silicon Wafers
Specification for Electrical Performance Characteristics of Vacuum Cleaners (Withdrawn 1985)
Standard Test Method for Size of Resilient Floor Tile by Dial Gage Method (Withdrawn 2004)