A collection of featured documents from our library that are popular among our users or otherwise noteworthy.
Standard Practice for Comparative Evaluation of the Imaging Properties of Dry Electrostatic Toners
Standard Practice for Evaluation of One-Time Carbon Paper in Carbon-Interleaved Business Forms by Use of an Electric Typewriter
Standard Practice for Determining the Resistance of Carbonless Papers to Capsular Damage
Standard Specification for Poly(Vinylidene Chloride) (PVDC) Plastic-Lined Ferrous Metal Pipe and Fittings (Withdrawn 2004)
Test Method for Bulk Density of Germanium Dioxide
Methods for Detection and Enumeration of Microbiological Contaminants in Water Used for Processing Electron and Microelectronic Devices
Practice for Nondestructive Ultrasonic Evaluation of Socket and Butt Joints of Thermoplastic Piping (Withdrawn 1989)
Standard Criteria for Implantable Thermoset Epoxy Plastics (Withdrawn 2024)
Specification for Silicone Elastomers Used in Medical Applications (Withdrawn 2001)
Standard Practice for Determining the Compatibility of One-Time Carbon Paper with Carbonless Copy Papers When Interleaved into the Same Manifold Set
Standard Test Method for Adhesion of Gasket Materials to Metal Surfaces
Standard Test Method for Evaluation of Carpet Embedded Dirt Removal Effectiveness of Household/Commercial Vacuum Cleaners
Standard Test Method for Using a Horizontal Pull Slipmeter (HPS) (Withdrawn 2022)
Method of Test for Phosphate in Electronic Grade Hydrogen Peroxide Solutions (Withdrawn 1992)
Standard Practice for Evaluating the Quality of Molded Poly(Vinyl Chloride) (PVC) Plastic Pipe Fittings by the Heat Reversion Technique
Practice for Cleaning Surfaces of Polished Silicon Slices (Withdrawn 1993)
Test Method for Measuring Diameter of Semiconductor Wafers (Withdrawn 2001)
Test Method for Distortion of Optical Lenses Used in Photomask Fabrication
Practice for Determining Safe Current Pulse Operating Regions for Metallization on Semiconductor Components (Withdrawn 1995)
Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components (Metric) (Withdrawn 2022)
Standard Test Method for Measuring MOSFET Drain Leakage Current
Standard Test Method for Measuring MOSFET Drain Leakage Current (Metric)
Standard Test Method for Measuring MOSFET Linear Threshold Voltage (Withdrawn 2006)
Method for Measuring MOSFET Saturated Threshold Voltage (Withdrawn 1985)
Method of Test for Tin in Electronic Grade Hydrogen Peroxide Solutions (Withdrawn 1989)