BSI BS EN 12544-2:2000

Withdrawn Revision
Non-destructive testing. Measurement and evaluation of the X-ray tube voltage -- Constancy check by the thick filter method

Best Price Guarantee Jun 15, 2000 English 12 Pages

This Document Has Been Superseded

A newer publication replaces it: BSI BS EN ISO 16526-1, BSI BS EN ISO 16526-2


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BSI BS EN 12544-2:2000

Non-destructive testing. Measurement and evaluation of the X-ray tube voltage -- Constancy check by the thick filter method

PUBLISH DATE 2000
PAGES 12
BSI BS EN 12544-2:2000

This standard specifies a constancy check of a X-ray system where mainly the X-ray voltage is checked and also the tube current and the constitution of the target which can be changing due to ageing of the tube.

The thick filter method is based on a measurement of the dose rate behind a defined thick filter using defined distances between the X-ray tube, the filter and the measuring device.

This method is very sensitive to changes of the voltage, but it does not provide an absolute value for the X-ray tube voltage.

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