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BSI BS EN 60749-4:2017

Semiconductor devices. Mechanical and climatic test methods -- Damp heat, steady state, highly accelerated stress test (HAST)
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BSI BS EN 60749-4:2017

Semiconductor devices. Mechanical and climatic test methods -- Damp heat, steady state, highly accelerated stress test (HAST)

PUBLISH DATE 2017
PAGES 14
BSI BS EN 60749-4:2017

This part of IEC 60749 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.

SDO BSI: British Standards Institution
Document Number EN 60749-4
Publication Date Nov. 28, 2017
Language en - English
Page Count
Revision Level
Supercedes
Committee EPL/47
Publish Date Document Id Type View
Nov. 28, 2017 BS EN 60749-4:2017 Revision
Sept. 10, 2002 BS EN 60749-4:2002 Revision