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BSI BS EN 61523-1:2002

Delay and power calculation standards -- Integrated circuit delay and power calculation systems

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BSI BS EN 61523-1:2002

Delay and power calculation standards -- Integrated circuit delay and power calculation systems

PUBLISH DATE 2002

Document Information

The scope of the DPCS standard is to make it possible for integrated circuit designers to analyze chip timing and power consistently across a broad set of EDA applications, for integrated circuit vendors to express timing and power information once (for a given technology), and for EDA vendors to meet their application performance and capacity needs.


SDO	BSI: British Standards Institution
Document Number	EN 61523-1
Publication Date	March 8, 2002
Language	en - English
Page Count
Revision Level
Supercedes
Committee	EPL/501

Publish Date	Document Id	Type	View
March 8, 2002	BS EN 61523-1:2002	Revision

SDO	Document	Title
IEEE	IEEE/IEC 61523-1	IEEE/IEC International Standard--Delay and power calculation standards--Part 1: Integrated Circuit (IC) Open Library Architecture (OLA)
IEEE	IEEE/IEC 61523-3	IEC/IEEE International Standard - Delay and Power Calculation Standards - Part 3: Standard Delay Format (SDF) for the Electronic Design Process
BSI	BSI BS IEC 61523-1	Delay and power calculation standards -- Integrated Circuit (IC) Open Library Architecture (OLA)
IEC	IEC 61523-1	Delay and power calculation standards - Part 1: Integrated Circuit (IC) Open Library Architecture (OLA)
BSI	BSI BS IEC 61523-3	Delay and power calculation standards -- Standard delay formaty (SDF) for the electronic design process
IEC	IEC 61523-3	Delay and power calculation standards - Part 3: Standard Delay Format (SDF) for the electronic design process
BSI	BSI BS EN 61523-2	Delay and power calculation standards -- Pre-layout delay calculation specification for CMOS ASIC libraries
BSI	BSI BS QC 790101	Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits. Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
BSI	BSI BS EN IEC 62566-2	Nuclear power plants. Instrumentation and control systems important to safety. Development of HDL-programmed integrated circuits -- HDL-programmed integrated circuits for systems performing category B or C functions
BSI	BSI BS QC 790107	Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Digital integrated circuits. Blank detail specification. Integrated circuit dynamic read/write memories
BSI	BSI BS IEC 61523-4	Delay and power calculation standards -- Design and Verification of Low-Power, Energy-Aware Electronic Systems
IEC	IEC 62566-2	Nuclear power plants - Instrumentation and control systems important to safety - Development of HDL-programmed integrated circuits - Part 2: HDL-programmed integrated circuits for systems performing category B or C functions
IEC	IEC 61523-4	Delay and power calculation standards - Part 4: Design and Verification of Low-Power, Energy-Aware Electronic Systems
BSI	BSI BS QC 760100	Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the qualification approval procedures
BSI	BSI BS QC 760200	Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures
BSI	BSI BS IEC 60748-2-20	Semiconductor devices. Integrated circuits -- Digital integrated circuits. Family specification. Low voltage integrated circuits
BSI	BSI BS QC 760101	Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedures
BSI	BSI BS QC 760201	Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures
NEMA	NEMA MG 10011	Power Index Calculation Procedure—Standard Rating Methodology for Power Drive Systems and Complete Drive Modules
BSI	BSI BS IEC 60748-2-11	Semiconductor devices. Integrated circuits. Digital integrated circuits -- Blank detail specification for single supply integrated circuit, electrically erasable, and programmable read-only memory
IEC	IEC 60748-2-20	Semiconductor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits
BSI	BSI BS EN 61800-9-2	Adjustable speed electrical power drive systems -- Ecodesign for power drive systems, motor starters, power electronics and their driven applications. Energy efficiency indicators for power drive systems and motor starters
BSI	BSI BS EN 61800-9-1	Adjustable speed electrical power drive systems -- Ecodesign for power drive systems, motor starters, power electronics and their driven applications. General requirements for setting energy efficiency standards for power driven equipment using the extended product approach (EPA) and semi analytic model (SAM)
IEEE	IEEE C37.16	American National Standard Low-Voltage Power Circuit Breakers and AC Power Circuit Protectors- Preferred Ratings, Related Requirements, and Application Recommendations
IEC	IEC 60748-20	Semiconductor devices. Integrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits