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BSI BS EN 62132-2:2011

Integrated circuits. Measurement of electromagnetic immunity -- Measurement of radiated immunity. TEM cell and wideband TEM cell method
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BSI BS EN 62132-2:2011

Integrated circuits. Measurement of electromagnetic immunity -- Measurement of radiated immunity. TEM cell and wideband TEM cell method

PUBLISH DATE 2011
PAGES 28
BSI BS EN 62132-2:2011

This International Standard specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances. The frequency range of this method is from 150 kHz to 1 GHz, or as limited by the characteristics of the TEM cell.

SDO BSI: British Standards Institution
Document Number EN 62132-2
Publication Date April 30, 2011
Language en - English
Page Count
Revision Level
Supercedes
Committee EPL/47
Publish Date Document Id Type View
April 30, 2011 BS EN 62132-2:2011 Revision