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BSI BS IEC 60747-10:1991

Semiconductor devices -- Generic specification for discrete devices and integrated circuits
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BSI BS IEC 60747-10:1991

Semiconductor devices -- Generic specification for discrete devices and integrated circuits

PUBLISH DATE 2011
PAGES 38
BSI BS IEC 60747-10:1991

This publication forms part of the IEC Quality Assessment System for Electronic Components (IECQ).

This publication is a generic specification for semiconductor devices: discrete devices and integrated circuits, including multichip integrated circuits, but excluding hybrid circuits.

It defines general procedures for quality assessment to be used in the IECQ System and gives general rules for:

  • measurement methods of electrical characteristics;

  • climatic and mechanical tests;

  • endurance tests.

NOTE This publication must be supplemented by the approved sectional, family and blank detail specifications, where they exist, appropriate to the specific individual type or types.

General procedures for quality assessment to be used in the IECQ system and general rules for measurement methods of electrical characteristics, climatic and mechanical tests and endurance tests.
SDO BSI: British Standards Institution
Document Number IEC 60747-10
Publication Date July 31, 2011
Language en - English
Page Count
Revision Level
Supercedes
Committee EPL/47
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