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BSI BS IEC 60747-14-11:2021

Semiconductor devices -- Semiconductor sensors. Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature
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BSI BS IEC 60747-14-11:2021

Semiconductor devices -- Semiconductor sensors. Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature

PUBLISH DATE 2021
PAGES 24
BSI BS IEC 60747-14-11:2021

This part of IEC 60747 defines the terms, definitions, configuration, and test methods can be used to evaluate and determine the performance characteristics of surface acoustic wavebased semiconductor sensors integrated with ultraviolet, illuminance, and temperature sensors. The measurement methods are for DC characteristics and RF characteristics, and the measurement method for RF characteristics includes a direct mode and differential amplifier mode based on feedback oscillation. This document excludes devices dealt with by TC 49: piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection.

SDO BSI: British Standards Institution
Document Number IEC 60747-14-11
Publication Date March 12, 2021
Language en - English
Page Count 24
Revision Level
Supercedes
Committee EPL/47
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