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BSI BS IEC 60747-18-1:2019

Semiconductor devices -- Semiconductor bio sensors. Test method and data analysis for calibration of lens-free CMOS photonic array sensors
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BSI BS IEC 60747-18-1:2019

Semiconductor devices -- Semiconductor bio sensors. Test method and data analysis for calibration of lens-free CMOS photonic array sensors

PUBLISH DATE 2019
PAGES 28
BSI BS IEC 60747-18-1:2019
Test method and data analysis for calibration of lens-free CMOS photonic array sensors.
SDO BSI: British Standards Institution
Document Number IEC 60747-18-1
Publication Date June 7, 2019
Language en - English
Page Count
Revision Level
Supercedes
Committee
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