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BSI BS IEC 61445:2012

Digital Test Interchange Format (DTIF)
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BSI BS IEC 61445:2012

Digital Test Interchange Format (DTIF)

PUBLISH DATE 2013
PAGES 112
BSI BS IEC 61445:2012

This standard defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following:

  1. UUT Model;

  2. Stimulus and Response;

  3. Fault Dictionary;

  4. Probe.

SDO BSI: British Standards Institution
Document Number IEC 61445
Publication Date May 31, 2013
Language en - English
Page Count
Revision Level
Supercedes
Committee EPL/501
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