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BSI BS IEC 61649:1997

Procedures for goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data
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BSI BS IEC 61649:1997

Procedures for goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data

PUBLISH DATE 1997
PAGES 18
BSI BS IEC 61649:1997
FOR WEIBULL DISTRIBUTED DATA
SDO BSI: British Standards Institution
Document Number IEC 61649
Publication Date Sept. 15, 1997
Language en - English
Page Count
Revision Level
Supercedes
Committee DS/1
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