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BSI BS IEC 62047-40:2021

Semiconductor devices. Micro-electromechanical devices -- Test methods of micro-electromechanical inertial shock switch threshold
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BSI BS IEC 62047-40:2021

Semiconductor devices. Micro-electromechanical devices -- Test methods of micro-electromechanical inertial shock switch threshold

PUBLISH DATE 2021
PAGES 14
BSI BS IEC 62047-40:2021

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SDO BSI: British Standards Institution
Document Number IEC 62047-40
Publication Date Sept. 14, 2021
Language en - English
Page Count
Revision Level
Supercedes
Committee EPL/47
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