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BSI BS IEC 62047-43:2024

Semiconductor devices. Micro-electromechanical devices -- Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices
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BSI BS IEC 62047-43:2024

Semiconductor devices. Micro-electromechanical devices -- Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices

PUBLISH DATE 2024
PAGES 22
BSI BS IEC 62047-43:2024
Semiconductor devices. Micro-electromechanical devices.Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices.
SDO BSI: British Standards Institution
Document Number IEC 62047-43
Publication Date March 22, 2024
Language en - English
Page Count
Revision Level
Supercedes
Committee EPL/47
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