Logo
Login Sign Up
Current Revision

BSI BS IEC 62047-46:2025

Semiconductor devices. Micro-electromechanical devices -- Silicon based MEMS fabrication technology. Measurement method of tensile strength of nanoscale thickness membrane
Best Price Guarantee
Instant

$222.36

2-5 Days

$222.36

SAVE 10%

$400.25


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


View in Library
or
British Standards Institution Logo

BSI BS IEC 62047-46:2025

Semiconductor devices. Micro-electromechanical devices -- Silicon based MEMS fabrication technology. Measurement method of tensile strength of nanoscale thickness membrane

PUBLISH DATE 2025
PAGES 18
BSI BS IEC 62047-46:2025

No overview provided by publisher

SDO BSI: British Standards Institution
Document Number IEC 62047-46
Publication Date April 30, 2025
Language en - English
Page Count 18
Revision Level
Supercedes
Committee EPL/47
Loading...

Failed to load document history.

Publish Date Document Id Type View