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BSI BS IEC 62525:2007

Standard test interface language (STIL) for digital test vector data
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BSI BS IEC 62525:2007

Standard test interface language (STIL) for digital test vector data

PUBLISH DATE 2007
PAGES 144
BSI BS IEC 62525:2007
Defines a test description language that: Facilitates the transfer of large volumes of digital test vector data from CAE environments to automated test equipment ATE environments; Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.
SDO BSI: British Standards Institution
Document Number IEC 62525
Publication Date Dec. 31, 2007
Language en - English
Page Count
Revision Level
Supercedes
Committee EPL/501
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