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BSI BS IEC 62526:2007

Standard for extensions to standard test interface language (STIL) for semiconductor design environments
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BSI BS IEC 62526:2007

Standard for extensions to standard test interface language (STIL) for semiconductor design environments

PUBLISH DATE 2007
PAGES 124
BSI BS IEC 62526:2007
Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE environments;(b) specifies patten, format, and timing information sufficant to define the application of digital test vectors to a DUT;and (c) supports the volume of test vector data generated from structured tests.
SDO BSI: British Standards Institution
Document Number IEC 62526
Publication Date Dec. 31, 2007
Language en - English
Page Count
Revision Level
Supercedes
Committee EPL/501
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