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BSI BS IEC 62528:2007

Standard testability method for embedded core-based integrated circuits
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BSI BS IEC 62528:2007

Standard testability method for embedded core-based integrated circuits

PUBLISH DATE 2007
PAGES 126
BSI BS IEC 62528:2007
Defines a mechanism for the test of core designs within a system on chip (SoC).This mechanism constitutes a hardware architecture and leverages the core test language (CTL)to faciliate communication between core designers and core integrators.
SDO BSI: British Standards Institution
Document Number IEC 62528
Publication Date Dec. 31, 2007
Language en - English
Page Count
Revision Level
Supercedes
Committee EPL/501
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