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BSI BS IEC 62860-1:2013

Test methods for the characterization of organic transistor-based ring oscillators
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BSI BS IEC 62860-1:2013

Test methods for the characterization of organic transistor-based ring oscillators

PUBLISH DATE 2014
PAGES 26
BSI BS IEC 62860-1:2013

This standard describes a method for characterizing organic electronic transistor-based ring oscillators, including measurement techniques, methods of reporting data, and the testing conditions during characterization.

SDO BSI: British Standards Institution
Document Number IEC 62860-1
Publication Date Aug. 31, 2014
Language en - English
Page Count
Revision Level
Supercedes
Committee NTI/1
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