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BSI BS IEC 62899-503-1:2020

Printed electronics -- Quality assessment. Test method of displacement current measurement for printed thin-film transistor
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BSI BS IEC 62899-503-1:2020

Printed electronics -- Quality assessment. Test method of displacement current measurement for printed thin-film transistor

PUBLISH DATE 2020
PAGES 18
BSI BS IEC 62899-503-1:2020
IEC 62899-503-1:2020(E) specifies a test method for displacement current measurement (DCM) for printed thin film transistors (TFTs) or organic thin film transistors (OTFTs).
SDO BSI: British Standards Institution
Document Number IEC 62899-503-1
Publication Date Sept. 25, 2020
Language en - English
Page Count 18
Revision Level
Supercedes
Committee AMT/9
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