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BSI BS IEC 63068-4:2022

Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices -- Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence
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BSI BS IEC 63068-4:2022

Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices -- Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence

PUBLISH DATE 2022
PAGES 28
BSI BS IEC 63068-4:2022
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices. Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence.
SDO BSI: British Standards Institution
Document Number IEC 63068-4
Publication Date Sept. 7, 2022
Language en - English
Page Count 28
Revision Level
Supercedes
Committee EPL/47
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