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BSI BS ISO 11938:2012

Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
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BSI BS ISO 11938:2012

Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy

PUBLISH DATE 2013
PAGES 22
BSI BS ISO 11938:2012

This International Standard provides procedures for electron microprobe elemental-mapping analysis using wavelength-dispersive spectrometry. The choice between mapping with the electron beam moving digitally across the specimen (electron beam mapping) and mapping with stage movement only (large-area mapping) is assessed. It describes five types of data processing: the raw X-ray intensity data method, the k-value method, the calibration method, the correlation method and the matrix correction method.

SDO BSI: British Standards Institution
Document Number ISO 11938
Publication Date April 30, 2013
Language en - English
Page Count
Revision Level
Supercedes
Committee CII/9
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