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BSI BS ISO 14975:2000

Surface chemical analysis. Information formats
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BSI BS ISO 14975:2000

Surface chemical analysis. Information formats

PUBLISH DATE 2001
BSI BS ISO 14975:2000

This International Standard specifies a format to supplement ISO 14976 to transfer data for the creation, expansion and revision of a surface chemical analysis spectral database. The format is applied to Auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS) spectral data.

SDO BSI: British Standards Institution
Document Number ISO 14975
Publication Date May 15, 2001
Language en - English
Page Count
Revision Level
Supercedes
Committee CII/60
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