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BSI BS ISO 17470:2014

Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
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BSI BS ISO 17470:2014

Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

PUBLISH DATE 2014
PAGES 22
BSI BS ISO 17470:2014

This International Standard gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a ÎĽm3 scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.

SDO BSI: British Standards Institution
Document Number ISO 17470
Publication Date Jan. 31, 2014
Language en - English
Page Count
Revision Level
Supercedes
Committee CII/9
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