Logo
Login Sign Up
Current Revision

BSI BS ISO 21222:2020

Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
Best Price Guarantee
Instant

$286.75

2-5 Days

$286.75

SAVE 10%

$516.15


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


View in Library
or
British Standards Institution Logo

BSI BS ISO 21222:2020

Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method

PUBLISH DATE 2020
PAGES 26
BSI BS ISO 21222:2020

This document describes a procedure for the determination of elastic modulus for compliant materials using atomic force microscope (AFM). Force-distance curves on the surface of compliant materials are measured and the analysis uses a two-point method based on Johnson-Kendall-Roberts (JKR) theory. This document is applicable to compliant materials with elastic moduli ranging from 100 kPa to 1 GPa. The spatial resolution is dependent on the contact radius between the AFM probe and the surface and is typically approximately10-20 nm.

SDO BSI: British Standards Institution
Document Number ISO 21222
Publication Date Feb. 7, 2020
Language en - English
Page Count 26
Revision Level
Supercedes
Committee CII/60
Loading...

Failed to load document history.

Publish Date Document Id Type View