Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
This document describes a procedure for the determination of elastic modulus for compliant materials using atomic force microscope (AFM). Force-distance curves on the surface of compliant materials are measured and the analysis uses a two-point method based on Johnson-Kendall-Roberts (JKR) theory. This document is applicable to compliant materials with elastic moduli ranging from 100 kPa to 1 GPa. The spatial resolution is dependent on the contact radius between the AFM probe and the surface and is typically approximately10-20Â nm.
| SDO | BSI: British Standards Institution |
| Document Number | ISO 21222 |
| Publication Date | Feb. 7, 2020 |
| Language | en - English |
| Page Count | 26 |
| Revision Level | |
| Supercedes | |
| Committee | CII/60 |
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