Logo
Login Sign Up
Current Revision

BSI BS ISO 22278:2020

Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
Best Price Guarantee
Instant

$336.38

2-5 Days

$336.38

SAVE 10%

$605.48


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


View in Library
or
British Standards Institution Logo

BSI BS ISO 22278:2020

Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam

PUBLISH DATE 2020
PAGES 38
BSI BS ISO 22278:2020

This document specifies the test method for measuring the crystalline quality of single-crystal thin film (wafer) using the XRD method with parallel X-ray beam. This document is applicable to all of the single-crystal thin film (wafer) as bulk or epitaxial layer structure.

SDO BSI: British Standards Institution
Document Number ISO 22278
Publication Date Aug. 26, 2020
Language en - English
Page Count 38
Revision Level
Supercedes
Committee RPI/13
Loading...

Failed to load document history.

Publish Date Document Id Type View