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BSI BS ISO 23830:2008

Surface chemical analysis. Secondary-ion mass spectrometry. Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
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BSI BS ISO 23830:2008

Surface chemical analysis. Secondary-ion mass spectrometry. Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry

PUBLISH DATE 2008
PAGES 24
BSI BS ISO 23830:2008

This International Standard specifies a method for confirming the repeatability and constancy of the positive-ion relative-intensity scale of static secondary-ion mass spectrometers, for general analytical purposes. It is only applicable to instruments that incorporate an electron gun for charge neutralization. It is not intended to be a calibration of the intensity/mass response function. That calibration may be made by the instrument manufacturer or another organization. The present method provides data to confirm the constancy of relative intensities with instrument usage. Guidance is given on some of the instrument settings that may affect this constancy.

SDO BSI: British Standards Institution
Document Number ISO 23830
Publication Date Dec. 31, 2008
Language en - English
Page Count
Revision Level
Supercedes
Committee CII/60
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