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BSI BS ISO 25387:2026

Microbeam analysis. Analytical electron microscopy. Procedures for determining the point resolution of high-resolution transmission electron microscope
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BSI BS ISO 25387:2026

Microbeam analysis. Analytical electron microscopy. Procedures for determining the point resolution of high-resolution transmission electron microscope

PUBLISH DATE 2026
PAGES 62
BSI BS ISO 25387:2026

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SDO BSI: British Standards Institution
Document Number ISO 25387
Publication Date June 12, 2026
Language en - English
Page Count 62
Revision Level
Supercedes
Committee CII/9
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