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BSI BS ISO 5618-2:2024

Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for GaN crystal surface defects -- Method for determining etch pit density
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BSI BS ISO 5618-2:2024

Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for GaN crystal surface defects -- Method for determining etch pit density

PUBLISH DATE 2024
PAGES 34
BSI BS ISO 5618-2:2024
Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for GaN crystal surface defects.Method for determining etch pit density.
SDO BSI: British Standards Institution
Document Number ISO 5618-2
Publication Date May 7, 2024
Language en - English
Page Count
Revision Level
Supercedes
Committee RPI/13
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