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BSI DD ENV 50219:1996

Description of the reliability test structures of the European mini test chip
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BSI DD ENV 50219:1996

Description of the reliability test structures of the European mini test chip

PUBLISH DATE 1996
PAGES 42
BSI DD ENV 50219:1996
WITHDRAWN, 4/20/2012
Documents the parametrized test structures of the JESSI Reliability Test Chip (RTC) which is part of the European Mini Test Chip (ETC).
SDO BSI: British Standards Institution
Document Number ENV 50219
Publication Date Sept. 15, 1996
Language en - English
Page Count
Revision Level
Supercedes
Committee EPL/501
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