Logo
Login Sign Up
Current Revision

BSI PD IEC/TR 61967-1-1:2015

Integrated circuits. Measurement of electromagnetic emissions -- General conditions and definitions. Near-field scan data exchange format
Best Price Guarantee
Instant

$431.32

2-5 Days

$431.32

SAVE 10%

$776.38


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


or
British Standards Institution Logo

BSI PD IEC/TR 61967-1-1:2015

Integrated circuits. Measurement of electromagnetic emissions -- General conditions and definitions. Near-field scan data exchange format

PUBLISH DATE 2015
PAGES 68
BSI PD IEC/TR 61967-1-1:2015

This part of IEC 61967 provides guidance for exchanging data generated by near-field scan measurements.

The described exchange format could also be used for near-field scan data generated by simulation or computation software. It should be noted that, although it has been developed for near-field scan, its use is not restricted to this application. The exchange format can be applied to emission and immunity near-field scan data in the frequency and time domains.

The scope of this technical report includes neither the methods used for the measurements or simulations, nor the software and algorithms used for generating the exchange file or for processing or viewing the data contained therein.

SDO BSI: British Standards Institution
Document Number IEC/TR 61967-1-1
Publication Date Sept. 30, 2015
Language en - English
Page Count
Revision Level
Supercedes
Committee EPL/47
Publish Date Document Id Type View
Sept. 30, 2015 PD IEC/TR 61967-1-1:2015 Revision
June 30, 2010 PD IEC/TR 61967-1-1:2010 Revision