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BSI PD IEC/TR 61967-4-1:2005

Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Measurement of conducted emissions. 1 Ohm/150 Ohm direct coupling method. Application guidance to IEC 61967-4
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BSI PD IEC/TR 61967-4-1:2005

Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Measurement of conducted emissions. 1 Ohm/150 Ohm direct coupling method. Application guidance to IEC 61967-4

PUBLISH DATE 2006
PAGES 50
BSI PD IEC/TR 61967-4-1:2005
Serves as an application guidance and relates to IEC 61967-4. The division of IC types into -> IC function modules and the software modules for -> cores with CPU can be used for Parts 3, 5 and 6 of IEC 61967. Gives advice for performing test methods described in IEC 61967-4 by classifying types of integrated circuits (ICs) and providing hints for test applications related to the IC type classification. To obtain comparable results of IC emission measurements using IEC 61967-4, definitions are given which are in addition to the general conditions specified in IEC 61967-1 and IEC 61967-4. These definitions concern IC related operating modes, pins and ports to be tested, test set-ups according IEC 61967-4, including description of load circuits and RF path, and IC related emission limits (or limit classes). Parts of the guidance provided by this technical report may be applicable to other parts of IEC 61967.
SDO BSI: British Standards Institution
Document Number IEC/TR 61967-4-1
Publication Date Jan. 30, 2006
Language en - English
Page Count 50
Revision Level
Supercedes
Committee EPL/47
Publish Date Document Id Type View
Jan. 30, 2006 PD IEC/TR 61967-4-1:2005 Revision