Nanomanufacturing. Key control characteristics -- Thin-film organic/nano electronic devices. Measurements of charge carrier concentration
This part of IEC TS 62607, which is a Technical Specification, specifies sample structures for evaluating a wide range of charge carrier concentration in organic/nano materials. This specification is provided for both capacitance-voltage (C-V) measurements in metal/insulator/semiconductor stacking structures and Hall-effect measurements with the van der Pauw configuration. Criteria for choosing measurement methods of charge carrier concentration in organic semiconductor layers are also given in this document.
| SDO | BSI: British Standards Institution |
| Document Number | IEC TS 62607-5-3 |
| Publication Date | April 22, 2020 |
| Language | en - English |
| Page Count | |
| Revision Level | |
| Supercedes | |
| Committee | NTI/1 |
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