ESDA ESD TR5.4-03-11

Current Revision

ESD Association Technical Report For Electrostatic Discharge Sensitivity Testing – Latch-Up Sensitivity Testing of CMOS/BiCMOS Integrated Circuits – Transient Latch-up Testing Component Level - Supply Transient Stimulation

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ESDA ESD TR5.4-03-11

Name: ESDA ESD TR5.4-03-11 – ESD Association Technical Report For Electrostatic Discharge Sensitivity Testing – Latch-Up Sensitivity Testing of CMOS/BiCMOS Integrated Circuits – Transient Latch-up Testing Component Level - Supply Transient Stimulation
Brand: Electrostatic Discharge Association
SKU: ESDA ESD TR5.4-03-11
Price: 25.00 USD
Availability: InStock

ESD Association Technical Report For Electrostatic Discharge Sensitivity Testing – Latch-Up Sensitivity Testing of CMOS/BiCMOS Integrated Circuits – Transient Latch-up Testing Component Level - Supply Transient Stimulation

PUBLISH DATE 2011

The information and procedures defined in this technical report may be used to search for latch-up sensitive layouts within integrated circuits. The stress levels and stimuli parameter values defined may be used for a wide range of devices. Levels and values can be scaled up or down to suit the requirements of the actual device under test and types of transient stimuli being used.