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IEC 60191-6-16 Ed. 1.0 b:2007

Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA
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IEC 60191-6-16 Ed. 1.0 b:2007

Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA

PUBLISH DATE 2007
PAGES 14
IEC 60191-6-16 Ed. 1.0 b:2007

Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA

IEC 60191-6-16:2007 gives a glossary of semiconductor sockets for BGA, LGA, FBGA and FLGA.

This standard intends to establish definitions and unification of terminology relating to tests and burn-in sockets for BGA, LGA, FBGA and FLGA.

SDO IEC: International Electrotechnical Commission
Document Number IEC 60191
Publication Date April 1, 2007
Language b - English & French
Page Count
Revision Level 1.0
Supercedes
Committee 47D
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