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IEC 60444-2 Ed. 1.0 b:1980

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
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IEC 60444-2 Ed. 1.0 b:1980

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units

PUBLISH DATE 1980
IEC 60444-2 Ed. 1.0 b:1980

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network.

Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units.

Describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz.

The method achieves a total measurement error of the order of 5%.

SDO IEC: International Electrotechnical Commission
Document Number IEC 60444
Publication Date Jan. 1, 1980
Language b - English & French
Page Count
Revision Level 1.0
Supercedes
Committee 49
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