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IEC 60512-10-4 Ed. 2.0 b:2003

Connectors for electronic equipment - Tests and measurements - Part 10-4: Impact tests (free components), static load tests (fixed components), endurance tests and overload tests - Test 10d: Electrical overload (connectors)
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IEC 60512-10-4 Ed. 2.0 b:2003

Connectors for electronic equipment - Tests and measurements - Part 10-4: Impact tests (free components), static load tests (fixed components), endurance tests and overload tests - Test 10d: Electrical overload (connectors)

PUBLISH DATE 2003
PAGES 22
IEC 60512-10-4 Ed. 2.0 b:2003

Connectors for electronic equipment - Tests and measurements - Part 10-4: Impact tests (free components), static load tests (fixed components), endurance tests and overload tests

Test 10d: Electrical overload (connectors)

Draws up a standard method to assess the performance of mated contact pairs of connectors with an electrical overload current flowing through them for a limited period of time between 100 ms and 20 s.

Is applicable to the electrical overload test of mated contact pairs of connectors.

SDO IEC: International Electrotechnical Commission
Document Number IEC 60512
Publication Date Aug. 1, 2003
Language b - English & French
Page Count
Revision Level 2.0
Supercedes
Committee 48B
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