Logo
Login Sign Up
Current Revision

IEC 60512-16-1 Ed. 1.0 b:2008

Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage
Best Price Guarantee
Instant

$25.41

2-5 Days

$25.41

SAVE 10%

$45.74


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


View in Library
or
International Electrotechnical Commission Logo

IEC 60512-16-1 Ed. 1.0 b:2008

Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage

PUBLISH DATE 2008
PAGES 16
IEC 60512-16-1 Ed. 1.0 b:2008

Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage

IEC 60512-16-1:2008 details a standard test method to assess the effectiveness of the elastic system of contacts to resist damage from the insertion of a specified test probe.

SDO IEC: International Electrotechnical Commission
Document Number IEC 60512
Publication Date June 1, 2008
Language b - English & French
Page Count
Revision Level 1.0
Supercedes
Committee 48B
Loading...

Failed to load document history.

Publish Date Document Id Type View