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IEC 60512-16-21 Ed. 1.0 b:2012

Connectors for electronic equipment - Tests and measurements - Part 16-21: Mechanical tests on contacts and terminations - Test 16u: Whisker test via the application of external mechanical stresses
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IEC 60512-16-21 Ed. 1.0 b:2012

Connectors for electronic equipment - Tests and measurements - Part 16-21: Mechanical tests on contacts and terminations - Test 16u: Whisker test via the application of external mechanical stresses

PUBLISH DATE 2012
PAGES 26
IEC 60512-16-21 Ed. 1.0 b:2012
Connectors for electronic equipment - Tests and measurements - Part 16-21: Mechanical tests on contacts and terminations - Test 16u: Whisker test via the application of external mechanical stresses
IEC 60512-16-21:2012 The object of this standard is to define a standard test method to assess the possibility of whisker growth by external mechanical stress on the tin and tin-alloy plated parts of a connector in its application (after wire termination, after soldering, after mounting, mated with counterpart). This standard does not cover internal stress type whisker. This part of IEC 60512, when required by the detail specification, is used for testing connectors within the scope of IEC technical committee 48. It may also be used for similar devices when specified in a detail specification. Keywords: Whisker growth, external mechanical stress
SDO IEC: International Electrotechnical Commission
Document Number IEC 60512
Publication Date May 7, 2012
Language b - English & French
Page Count 26
Revision Level 1.0
Supercedes
Committee 48B
Publish Date Document Id Type View
May 7, 2012 IEC 60512-16-21 Ed. 1.0 b:2012 Revision
May 7, 2012 Revision