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IEC 60512-24-1 Ed. 1.0 b:2010

Connectors for electronic equipment - Tests and measurements - Part 24-1: Magnetic interference tests - Test 24a: Residual magnetism
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IEC 60512-24-1 Ed. 1.0 b:2010

Connectors for electronic equipment - Tests and measurements - Part 24-1: Magnetic interference tests - Test 24a: Residual magnetism

PUBLISH DATE 2010
PAGES 12
IEC 60512-24-1 Ed. 1.0 b:2010

Connectors for electronic equipment - Tests and measurements

Part 24-1: Magnetic interference tests - Test 24a: Residual magnetism

IEC 60512-24-1:2010, when required by the detail specification, is used for testing connectors within the scope of technical committee 48.

It may also be used for similar devices when specified in a detail specification.

The object of this standard is to detail a standard method to measure the residual magnetism of a connector after exposure to a specified magnetic field.

SDO IEC: International Electrotechnical Commission
Document Number IEC 60512
Publication Date March 1, 2010
Language b - English & French
Page Count
Revision Level 1.0
Supercedes
Committee 48B
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