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IEC 60512-25-6 Ed. 1.0 b:2004

Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitter
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IEC 60512-25-6 Ed. 1.0 b:2004

Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitter

PUBLISH DATE 2004
PAGES 44
IEC 60512-25-6 Ed. 1.0 b:2004

Connectors for electronic equipment - Tests and measurements

Part 25-6: Test 25f: Eye pattern and jitter

Describes methods for measuring an eye pattern response and jitter in the time domain.

SDO IEC: International Electrotechnical Commission
Document Number IEC 60512
Publication Date May 1, 2004
Language b - English & French
Page Count
Revision Level 1.0
Supercedes
Committee 48B
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