IEC 60512-25-6 Ed. 1.0 b:2004

Current Revision
Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitter

Best Price Guarantee May 1, 2004 EN/FR 44 Pages

Sub Total (1 Item(s)) $ 0.00
Estimated Shipping $ 0.00
Total (Pre-Tax) $ 0.00
View in Library
or
International Electrotechnical Commission Logo

Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitter

PUBLISH DATE 2004
PAGES 44

Connectors for electronic equipment - Tests and measurements

Part 25-6: Test 25f: Eye pattern and jitter

Describes methods for measuring an eye pattern response and jitter in the time domain.

Loading...

Failed to load document history.

Publish Date Document Id Type View