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IEC 60747-5-11 Ed. 1.0 en:2019

Semiconductor devices - Part 5-11: Optoelectronic devices - Light emitting diodes - Test method of radiative and nonradiative currents of light emitting diodes
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IEC 60747-5-11 Ed. 1.0 en:2019

Semiconductor devices - Part 5-11: Optoelectronic devices - Light emitting diodes - Test method of radiative and nonradiative currents of light emitting diodes

PUBLISH DATE 2019
PAGES 18
IEC 60747-5-11 Ed. 1.0 en:2019

Semiconductor devices - Part 5-11: Optoelectronic devices - Light emitting diodes - Test method of radiative and nonradiative currents of light emitting diodes

IEC 60747-5-11:2019(E) specifies the measuring methods of radiative and nonradiative currents of single light emitting diode (LED) chips or packages without phosphor.

White LEDs for lighting applications are out of the scope of this document.

This document utilizes the internal quantum efficiency (IQE) as a function of current, whose measurement methods are discussed in other documents.

SDO IEC: International Electrotechnical Commission
Document Number IEC 60747
Publication Date Dec. 1, 2019
Language en - English
Page Count
Revision Level 1.0
Supercedes
Committee 47E
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