Logo
Login Sign Up
Current Revision

IEC 60747-5-8 Ed. 1.0 b:2019

Semiconductor devices - Part 5-8: Optoelectronic devices - Light emitting diodes - Test method of optoelectronic efficiencies of light emitting diodes
Best Price Guarantee

$145.53

2-5 Days

$145.53

SAVE 10%

$261.95


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


View in Library
or
International Electrotechnical Commission Logo

IEC 60747-5-8 Ed. 1.0 b:2019

Semiconductor devices - Part 5-8: Optoelectronic devices - Light emitting diodes - Test method of optoelectronic efficiencies of light emitting diodes

PUBLISH DATE 2019
PAGES 40
IEC 60747-5-8 Ed. 1.0 b:2019

Semiconductor devices - Part 5-8: Optoelectronic devices - Light emitting diodes

Test method of optoelectronic efficiencies of light emitting diodes

IEC 60747-5-8:2019 specifies the terminology and the measuring methods of various efficiencies of single light emitting diode (LED) chips or packages without phosphor.

White LEDs for lighting applications are out of the scope of this part of IEC 60747.

The efficiencies whose measuring methods are defined in this part are:

  • the power efficiency (PE),
  • the external quantum efficiency (EQE),
  • the voltage efficiency (VE), and
  • the light extraction efficiency (LEE).

To measure the LEE, the measurement data of the internal quantum efficiency (IQE) is used, whose measuring method is discussed in IEC 60747-5-9 and IEC 60747-5-10.

The injection efficiency (IE) and the radiative efficiency (RE) are given definitions only.

SDO IEC: International Electrotechnical Commission
Document Number IEC 60747
Publication Date Nov. 1, 2019
Language b - English & French
Page Count
Revision Level 1.0
Supercedes
Committee 47E
Loading...

Failed to load document history.

Publish Date Document Id Type View