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IEC 60749-11 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
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IEC 60749-11 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method

PUBLISH DATE 2002
PAGES 22
IEC 60749-11 Ed. 1.0 b:2002
Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
Defines the rapid change of temperature test method and the two-fluid-bath method. This test method may also be used, employing fewer cycles, to test the effect of immersion in heated liquids that are used for the purpose of cleaning devices. This test is applicable to all semiconductor devices. It is considered destructive unless otherwise detailed in the relevant specification.
SDO IEC: International Electrotechnical Commission
Document Number IEC 60749
Publication Date April 1, 2002
Language b - English & French
Page Count
Revision Level 1.0
Supercedes
Committee 47
Publish Date Document Id Type View
April 1, 2002 IEC 60749-11 Ed. 1.0 b:2002 Revision
April 1, 2002 Revision