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IEC 60749-12 Ed. 2.0 b:2017

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
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IEC 60749-12 Ed. 2.0 b:2017

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

PUBLISH DATE 2017
IEC 60749-12 Ed. 2.0 b:2017
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
IEC 60749-12:2017 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages
This second edition cancels and replaces the first edition published in 2002. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
a) alignment with MIL-STD-883J Method 2007, Vibration, variable frequency.

SDO IEC: International Electrotechnical Commission
Document Number IEC 60749
Publication Date Dec. 1, 2017
Language b - English & French
Page Count
Revision Level 2.0
Supercedes
Committee 47
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