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IEC 60749-17 Ed. 2.0 b:2019

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
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IEC 60749-17 Ed. 2.0 b:2019

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

PUBLISH DATE 2019
PAGES 22
IEC 60749-17 Ed. 2.0 b:2019
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
IEC 60749-17:2019 is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military- and aerospace-related applications. It is a destructive test.
This edition includes the following significant technical changes with respect to the previous edition:
  1. updates to better align the test method with MIL-STD 883J, method 1017, including removal of restriction of use of the document, and a requirement to limit the total ionization dose;
  2. addition of a Bibliography, including US MIL- and ASTM standards relevant to this test method.
SDO IEC: International Electrotechnical Commission
Document Number IEC 60749
Publication Date March 1, 2019
Language b - English & French
Page Count
Revision Level 2.0
Supercedes
Committee 47
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