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IEC 60749-2 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
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IEC 60749-2 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure

PUBLISH DATE 2002
PAGES 20
IEC 60749-2 Ed. 1.0 b:2002
Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
Covers the testing of low air pressure on semiconductor devices. The test is intended primarily to determine the ability of component parts and materials to avoid voltage breakdown failures due to the reduced dielectric strength of air and other insulating materials at reduced pressures is only applicable to devices where the operating voltage exceeds 1 000 V. This test is applicable to all semiconductor devices provided they are in cavity type packages. The test is intended for military and space-related applications only.
SDO IEC: International Electrotechnical Commission
Document Number IEC 60749
Publication Date April 2, 2002
Language b - English & French
Page Count
Revision Level 1.0
Supercedes
Committee 47
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