Logo
Login Sign Up
Current Revision

IEC 60749-31 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
Best Price Guarantee
Instant

$33.00

2-5 Days

$33.00

SAVE 10%

$59.40

Modifications (Amendments, Corrigenda, Errata, etc.)

$0.00

$0.00

$0.00


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


View in Library
or
International Electrotechnical Commission Logo

IEC 60749-31 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)

PUBLISH DATE 2002
PAGES 18
IEC 60749-31 Ed. 1.0 b:2002
Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads.
SDO IEC: International Electrotechnical Commission
Document Number IEC 60749
Publication Date Aug. 1, 2002
Language b - English & French
Page Count
Revision Level 1.0
Supercedes
Committee 47
Loading...

Failed to load document history.

Publish Date Document Id Type View