IEC 60749-36 Ed. 1.0 b:2003

Current Revision
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state

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Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state

PUBLISH DATE 2003
PAGES 16

Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state

Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices.

It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.

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